-600x600.jpg "KS-520 Spectrophotometer")
-600x600.jpg "KS-520 Spectrophotometer")
-600x600.jpg "KS-520 Spectrophotometer")
-600x600.jpg "KS-520 Spectrophotometer")
-600x600.jpg "KS-520 Spectrophotometer")
KS-520 Spectrophotometer
3NH KS-520 A flagship all-round model integrating 12 full apertures, fluorescence measurement, and small-area inspection. It delivers repeatability of ΔEab ≤ 0.025 and inter-instrument agreement of ΔEab ≤ 0.3. Equipped with a UV light source and nanoscale spectroscopic technology, it is supported by Class-I metrological certification for guaranteed accuracy. The 12 apertures include a dedicated 1×3 mm size for small areas, making it suitable for flat surfaces, curved surfaces, micro components, and a full range of sample types. It supports multi-system collaboration and cloud data management, meeting complex color measurement needs across industries such as plastics and electronics, textile dyeing, and precision manufacturing.
Full-Form Adaptability
1.Comprehensive Form Coverage
Equipped with 12 full-spec apertures (including a 1×3 mm micro model), specifically: 3 mm flat tip, 3 mm pointed tip, 5 mm flat tip, 5 mm pointed tip, 6 mm flat tip, 6 mm pointed tip, 10 mm flat tip, 10 mm pointed tip, 11 mm flat tip, 11 mm pointed tip, 1×3 mm flat tip, and 1×3 mm pointed tip. Covers everything from conventional samples to precision micro parts, accommodating flat surfaces, curved surfaces, textured surfaces, and various sample geometries.
2.Wide Sample Compatibility
Equipped with a UV light source and full-spectrum LED, it accurately measures both conventional materials and fluorescent samples, delivering broader application versatility.
3.Multiple Color Spaces & Observation Light Sources
It supports a wide range of color spaces including CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, HunterLab ,βxy,DIN Lab99，as well as numerous observation light sources such as D65,A,C,D50,D55,D75, F1,F2(CWF),F3,F4,F5, F6,F7(DLF),F8 ,F9,F10(TPL5),F11(TL84),F12(TL83/U30),U35,NBF,ID50 and ID65This enables specialized measurement requirements under various conditions.
